Improve solar cell efficiency and manufacturing yields through BTi’s patent protected LIS. The LIS enables applications such as efficient quality control, process control, process monitoring and R&D for manufacturers of silicon wafers, solar cells and solar modules. BTi’s LIS provides fast, efficient spatially resolved data for quickly diagnosing and correcting manufacturing problems, as well as very efficient process monitoring and process control. The product platform can measure many characteristics of solar cells and wafers such as minority carrier lifetime, diffusion length, series resistance, shunt detection, crack detection, Iron concentration and more.

Product Applications:

Silicon Wafer
* Minority Carrier Lifetime
* Crack Detection
* Shunt Detection
* Iron Concentration

Silicon Solar Cell
* Series Resistance (RS)
* Diffusion Length (LD)
* Crack Detection
* Shunt Detection

NON IMAGING
* Injection Level Dependant lifetime
* Bulk Doping

NON IMAGING
* Suns Voc
* Light IV
* Dark IV

Advantages of PL imaging using BTi’s LIS:

* Contactless
* Fast
* Spatially resolved
* Accurate
* Robust against various artifacts
* Non-destructive